|Title||Non-resonant X-ray/laser interaction spectroscopy as a method for assessing charge competition, trapping and luminescence efficiency in wide band-gap materials|
|Author(s)||Poolton, N.R.J.; Bos, A.J.J.; Wallinga, J.; Haas, J.T.M. De; Dorenbos, P.; Vries, L. De; Kars, R.H.; Jones, G.O.; Drozdowski, W.|
|Source||Journal of Luminescence 130 (2010)8. - ISSN 0022-2313 - p. 1404 - 1414.|
|Publication type||Refereed Article in a scientific journal|
|Keyword(s)||OSL - Radioluminescence - TL - Trapping|
Using a conventional fast-shuttered laboratory X-ray source in combination with pulsed laser diode modules, the possibilities for undertaking X-ray/laser interaction spectroscopy in wide band-gap luminescent materials are explored. It is shown that in such materials, a variety of X-ray/laser timing sequences can extract complimentary information regarding the charge-carrier trapping, de-trapping and recombination processes. The effects on the luminescence are illustrated for six example materials (YPO4:Ce,Sm, Lu 3Al5O12:Pr, Al2O3:C, natural sodium feldspar NaAlSi3O8, cubic BN and type IIa natural diamond). By ramping the temperature from 10 to 320 K during repeated X-ray pump/laser-probe activation cycles, a rapid assessment can be made of the important thermally dependent changes to the charge carrier trapping competition processes.